■경력
2018 ~ 현재 : 한양대학교 공학대학 산업경영공학과 조교수
2015 ~ 2018 : Senior Researcher in Korea Institute of Science and Technology Information, Seoul, Korea
2011 ~ 2015 : Research Assistant in Rutgers University, Piscataway, New Jersey, USA
2011 ~ 2013 : Teaching Assistant in Rutgers University, Piscataway, New Jersey, USA
■주요연구과제
시장 분석 및 신규 거래처 발굴을 위한 기계학습 알고리즘 연구 / (재)한국연구재단
산업인공지능 전문인력양성사업 / 한국전자기술연구원
혁신데이터 인프라 구축 및 운영사업 / 한국전자기술연구원
■주요논문
Kim, B., Jeong, Y. S., & Jeong, M. K. (2020). New multivariate kernel density estimator for uncertain data classification. Annals of Operations Research, 1-19
Choi, J., Kim, B., Han, C. H., Hahn, H., Park, H., Yoo, J., & Jeong, M. K. (2020). Methodology for assessing the contribution of knowledge services during the new product development process to business performance. Expert Systems with Applications, 113860
Joo, T., Kang, D., & Kim, B. (2020). Regularizing activations in neural networks via distribution matching with the Wasserstein metric. arXiv preprint arXiv:2002.05366
Choi, J., Tosyali, A., Kim, B., Lee, H. S., & Jeong, M. K. (2019). A Novel Method for Identifying Competitors Using a Financial Transaction Network. IEEE Transactions on Engineering Management
Lee, J., Kim, B., & Ahn, S. (2019). Maintenance Optimization for Repairable Deteriorating Systems under Imperfect Preventive Maintenance. Mathematics, 7(8), 716
Kim, B., Jeong, Y. S., Tong, S. H., & Jeong, M. K. (2020). A generalised uncertain decision tree for defect classification of multiple wafer maps. International Journal of Production Research, 58(9), 2805-2821
Choi, J., Kim, B., Jeong, Y., Han, H., Yoo, J., and Jeong, M. K. (2017). Data mining-based variable assessment methodology for evaluating the contribution of characteristics of knowledge services of a public research institute to business performance of firms. Expert Systems with Applications, 84, 37–48
Kim, B., Gazzola, G., Lee, J. M., Kim, Coh, B. Y., and Jeong, M. K. (2017). Two phase edge outlier detection model for technology opportunity discovery. Scientometrics, 113(1), 1-16
Sung, T.-E., Lee, J., Kim, B., Jun, S.-P., Pakr, H.-W. (2017). The study on the elaboration of technology valuation model and the adequacy of volatility based on real options. Journal of Korea Technology Innovation Society, 20(3), 732-753
Kim, B., Jeong, Y. S., Tong, S. H., Chang, I. K., and Jeong, M. K. (2016). Step-down spatial randomness test for detecting abnormalities in DRAM wafers with multiple spatial maps. IEEE Transactions on Semiconductor Manufacturing, 29(1), 57-65
Rodriguez, A., Tosyali, A., Kim, B., Choi, J., Lee, J. M., Coh, B. Y., and Jeong, M. K. (2016). Patent clustering and outlier ranking methodologies for attributed patent citation networks for technology opportunity discovery. IEEE Transactions on Engineering Management, 63(4), 426-437